2

Measurement of thin film thickness by electronic speckle pattern interferometry

Year:
2004
Language:
english
File:
PDF, 362 KB
english, 2004
3

Frequency-dependent conductivity in unannealed thin films of As0.40Se0.40Te0.20

Year:
2007
Language:
english
File:
PDF, 263 KB
english, 2007
6

Frequency-dependent conductivity in As2Se3 and As2Te3 thin films

Year:
2005
Language:
english
File:
PDF, 157 KB
english, 2005